Title :
Spectral response modelling of a-Si:H solar cells using accurate light absorption profiles
Author :
Stiebig, H. ; Kreisel, A. ; Winz, K. ; Schultz, N. ; Beneking, C. ; Eickhoff, Th. ; Wagner, H. ; Meer, M.
Author_Institution :
Inst. fur Schicht- und Ionentechnik, Forschungszentrum Julich GmbH, Germany
Abstract :
An optical model calculating the generated carrier profile in a-Si:H solar cells deposited on hazy and nonhazy transparent conducting oxide (TCO) has been integrated into a numerical transport and recombination program. A comparison of simulated and measured reflectances of pin structures opens up a possibility to check the prepared layer thicknesses and the optical device properties. Furthermore, the examination of the current gain employing a ZnO/metal back contact reveals the importance of using accurate light absorption profiles for spectral response modelling and device characterisation of pin solar cells
Keywords :
amorphous semiconductors; electron-hole recombination; elemental semiconductors; hydrogen; light absorption; light propagation; reflectivity; semiconductor device models; semiconductor-metal boundaries; silicon; silver; solar cells; zinc compounds; Si:H; ZnO-Ag; ZnO/metal back contact; a-Si:H solar cells; accurate light absorption profiles; coherent wave propagation; device characterisation; generated carrier profile; hazy transparent conducting oxide; incoherent wave propagation; measured reflectance; nonhazy transparent conducting oxide; numerical transport and recombination program; optical model; pin solar cells; pin structures; simulated reflectance; spectral response modelling; Absorption; Numerical models; Optical devices; Optical films; Optical refraction; Optical sensors; Optical variables control; Photovoltaic cells; Reflectivity; Solar power generation;
Conference_Titel :
Photovoltaic Energy Conversion, 1994., Conference Record of the Twenty Fourth. IEEE Photovoltaic Specialists Conference - 1994, 1994 IEEE First World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
0-7803-1460-3
DOI :
10.1109/WCPEC.1994.520033
