Title :
Constrained Via Minimisation In Greedy Channel Routing
Author :
Rao, K. Ramoji ; Raghunathan, K.S.
Author_Institution :
Indian Telephone Industries
Keywords :
Degradation; Integrated circuit interconnections; Integrated circuit yield; Joining processes; Logic; Minimization methods; Routing; Telephony; Very large scale integration; Wire;
Conference_Titel :
VLSI Design, 1992. Proceedings., The Fifth International Conference on
Print_ISBN :
0-8186-2465-5
DOI :
10.1109/ICVD.1992.658060