• DocumentCode
    2913012
  • Title

    Promising Complex ASIC Design Verification Methodology

  • Author

    Assaf, Mansour H. ; Das, Sunil R. ; Hernias, W. ; Jone, Wen B.

  • Author_Institution
    Univ. of Trinidad & Tobago, O´´Meara
  • fYear
    2007
  • fDate
    1-3 May 2007
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper aims at developing a design verification environment for complex application-specific integrated circuits (ASICs), with particular emphasis on embedded systems incorporating intellectual property (IP) cores. There exist methods to ensure correct design for IP core-based systems, but a promising approach to realize this is through the use of coverage-driven functional verification (CDV) and reuse methodology (RM). The CDV approach is based on the ASIC functionalities, and the verification process is accomplished in the early stages of the design. The use of functional coverage minimizes the number of test cases and thus enhances the verification process. The deterministic testing together with CDV and RM is applied to verify designs in the paper. The Specman e-language is used as a verification tool in the process since it incorporates the capabilities of both CDV and RM.
  • Keywords
    application specific integrated circuits; integrated circuit design; complex ASIC design verification methodology; complex application-specific integrated circuits; coverage-driven functional verification; intellectual property cores; reuse methodology; Application specific integrated circuits; Circuit testing; Costs; Design engineering; Design methodology; Embedded computing; Hardware design languages; Integrated circuit testing; Intellectual property; Time to market; Complex application-specific integrated circuits (ASICs); Verilog; coverage-driven functional verification (CDV) and reuse methodology (RM); design under test (DUT); deterministic testing; intellectual property (IP) cores; random input generator;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference Proceedings, 2007. IMTC 2007. IEEE
  • Conference_Location
    Warsaw
  • ISSN
    1091-5281
  • Print_ISBN
    1-4244-0588-2
  • Type

    conf

  • DOI
    10.1109/IMTC.2007.379056
  • Filename
    4258344