Title :
A theoretical basis for post-fabrication tuning of electronic circuits
Author :
Liu, P.C.K. ; Chung, V.W.W.
Author_Institution :
Dept. of Electron. Eng., Hong Kong Polytech., Hung Hom, Hong Kong
Abstract :
In this paper, the fundamental concept of design tolerancing and tuning is presented. The necessary and sufficient conditions of tuning based on the concept of projection is addressed. The concepts could be used for an optimal total design with maximum final yield and minimum costs. The optimal total design problem includes post-fabrication tuning costs and yield improvement in the design stage. The ultimate goal of the research is to develop schemes for automatic tuning of electronic circuits
Keywords :
circuit optimisation; circuit tuning; impedance matching; microwave circuits; network synthesis; tolerance analysis; design tolerancing; electronic circuits; maximum final yield; minimum costs; necessary and sufficient conditions; optimal total design; post-fabrication tuning; projection; yield improvement; Circuit analysis; Circuit optimization; Cost function; Design engineering; Electronic circuits; Fabrication; Manufacturing; Microwave circuits; Production; Sufficient conditions;
Conference_Titel :
Industrial Electronics, Control and Instrumentation, 1994. IECON '94., 20th International Conference on
Conference_Location :
Bologna
Print_ISBN :
0-7803-1328-3
DOI :
10.1109/IECON.1994.397954
