Title :
A new method for system diagnosis
Author :
Xu, Shiyi ; Gao, Jianhua
Author_Institution :
Shanghai Univ. of Sci. & Technol., China
Abstract :
With the advent of parallel computing systems, the fault diagnosis of such systems becomes increasingly challenging and critical. In this paper, we first introduce the concept of binary decision diagram (BDD), based on which we present an efficient way to locate the faulty units according to what we call fault symptom (FS). The new technique is then proved to be optimal (shortest) in time-consuming. Finally, an intelligent searching procedure for fault diagnosis is given
Keywords :
automatic testing; computational complexity; decision support systems; fault diagnosis; fault location; knowledge based systems; parallel algorithms; search problems; binary decision diagram; fault diagnosis; fault symptom; intelligent searching procedure; parallel computing; system diagnosis; Acceleration; Binary decision diagrams; Boolean functions; Data structures; Decision making; Equations; Fault diagnosis; Input variables; Parallel processing; System testing;
Conference_Titel :
Test Symposium, 1993., Proceedings of the Second Asian
Conference_Location :
Beijing
Print_ISBN :
0-8186-3930-X
DOI :
10.1109/ATS.1993.398794
