DocumentCode :
2913594
Title :
A FEM punch-through IGBT model using an efficient parameter extraction method
Author :
Chibante, Rui ; Araujo, Armando ; Carvalho, Adriano
Author_Institution :
Instituto Superior de Engenhario do Porto (ISEP)
fYear :
2005
fDate :
6-6 Nov. 2005
Abstract :
A finite element physics-based punch-through IGBT model is presented. The model´s core is based on solving the ambipolar diffusion equation (ADE) trough a variational formulation, resulting in a system of ODEs. The approach enables an easy implementation into a standard circuit simulator SPICE by means of an electrical analogy with the resulting system of ODEs, solved as a set of current controlled RC nets that describes charge carrier distribution in low-doped zone. The issue of parameter extraction for physics-based IGBT models is also addressed. An optimisation-based algorithm enabling an efficient parameter extraction method for IGBT model is discussed. Model is validated comparing experimental and simulated results
Keywords :
SPICE; circuit simulation; finite element analysis; insulated gate bipolar transistors; optimisation; variational techniques; FEM punch-through IGBT model; RC nets; ambipolar diffusion equation; charge carrier distribution; circuit simulator SPICE; optimisation; parameter extraction method; variational formulation; Circuit simulation; Data mining; Equations; Finite element methods; Insulated gate bipolar transistors; Parameter extraction; Physics; Power system modeling; SPICE; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics Society, 2005. IECON 2005. 31st Annual Conference of IEEE
Conference_Location :
Raleigh, NC
Print_ISBN :
0-7803-9252-3
Type :
conf
DOI :
10.1109/IECON.2005.1568986
Filename :
1568986
Link To Document :
بازگشت