DocumentCode :
2913608
Title :
Flip chip assembly on organic boards using anisotropic conductive adhesives (ACAs) and nickel/gold bumps
Author :
Paik, Kyung-Wook ; Yim, Myung-Jin ; Jeon, Young-Doo
Author_Institution :
Dept. of Mater. Sci. & Eng., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea
fYear :
2000
fDate :
2000
Firstpage :
378
Lastpage :
384
Abstract :
Flip chip assembly directly on organic boards offers miniaturization of package size and reduced in interconnection distances, resulting in a high performance and cost-competitive packaging method. This paper describes the investigation of alternative low cost flip-chip mounting processes using electroless Ni/Au bumps and anisotropic conductive adhesives/films as an interconnection material on organic boards such as FR-4. As bumps for flip chip, electroless Ni/Au plating was performed and characterized for plating speed, surface roughness, and elemental analysis as a function of plating condition. High plating rate and surface planarity of the electroless Ni were considered as requirements for ACA flip chip bumps. In order to obtain high plating rate and low surface roughness, plating conditions were determined by controlling complexing agents in electroless Ni solution. Annealing effects on Ni bump characteristics showed that the formation of crystalline Ni with Ni3P precipitation above 300°C causes an increase in hardness and intrinsic stress, resulting in reliability limitation. As an interconnect material, modified ACFs composed of Ni conductive fillers for electrical conductor and nonconductive inorganic fillers for modification of film properties such as CTE and tensile strength were formulated for improved electrical and mechanical properties of ACF interconnection. The thermal cycle life of ACAs flip chip on organic boards was usually limited by the CTE mismatch between chip and board. However, flip chip assembly on FR-4 boards using modified ACAs almost doubled the thermal cycle life
Keywords :
adhesives; annealing; chip-on-board packaging; conducting polymers; flip-chip devices; gold; hardness; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; internal stresses; microassembling; nickel; precipitation; surface topography; tensile strength; thermal expansion; 300 C; ACA flip chip bumps; ACAs; ACF interconnection; CTE; CTE mismatch; FR-4; FR-4 boards; Ni bump characteristics; Ni conductive fillers; Ni-Au; Ni3P; Ni3P precipitation; anisotropic conductive adhesives; anisotropic conductive films; annealing effects; controlling complexing agents; cost-competitive packaging method; crystalline Ni formation; electrical conductor; electrical properties; electroless Ni; electroless Ni solution; electroless Ni/Au bumps; electroless Ni/Au plating; elemental analysis; film properties modification; flip chip; flip chip assembly; flip chip on organic boards; flip-chip mounting process cost; flip-chip mounting processes; hardness; interconnect material; interconnection distance; interconnection material; intrinsic stress; mechanical properties; miniaturization; modified ACAs; modified ACFs; nickel/gold bumps; nonconductive inorganic fillers; organic boards; package size; plating condition; plating conditions; plating rate; plating speed; reliability limitation; surface planarity; surface roughness; tensile strength; thermal cycle life; Anisotropic magnetoresistance; Assembly; Conducting materials; Conductive films; Flip chip; Gold; Mechanical factors; Packaging; Rough surfaces; Surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference, 2000. (EPTC 2000). Proceedings of 3rd
Print_ISBN :
0-7803-6644-1
Type :
conf
DOI :
10.1109/EPTC.2000.906404
Filename :
906404
Link To Document :
بازگشت