DocumentCode :
2913627
Title :
Stacked multicell converter (SMC): reconstruction of flying capacitor voltages
Author :
Lienhardt, A.M. ; Gateau, G. ; Meynard, T.A.
Author_Institution :
Lab. d´´Electrotechnique et d´´Electronique Industrielle, Unite Mixte de Recherche INPT-ENSEEIHT/CNRS, Toulouse
fYear :
2005
fDate :
6-6 Nov. 2005
Abstract :
We present in this paper a new method for the observation of the flying capacitor voltages dedicated to stacked multicell converters (SMC). Unlike the imbricated-cell converter, the new SMC topology allows increasing the input voltage level while decreasing the energy stored in the converter. This consists of a hybrid association of commutation cells, which enables to share the voltage constraint on several switches. During normal operation, the flying capacitor voltages have to be kept constant by the control strategy. Due to high voltage/high power applications, it is difficult and expensive to measure the flying capacitor voltages. Therefore, a new method has been developed to estimate those voltages. After an introduction and a brief reminder on the SMC topology, we will present a new strategy to estimate the capacitor voltages based on the determination of an image of those ones regarding the control signals and the chopped voltage. The influence of the measurement noise on our new technique has also been studied carefully and appropriate strategies have been developed. The last part will be devoted to conclusions and perspectives
Keywords :
measurement errors; power convertors; voltage control; voltage measurement; SMC; commutation cells; energy storage; flying capacitor; imbricated-cell converter; stacked multicell converter; voltage control; voltage measurement; Capacitors; IEEE members; Image reconstruction; Noise measurement; Power measurement; Semiconductor device noise; Sliding mode control; Switches; Topology; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics Society, 2005. IECON 2005. 31st Annual Conference of IEEE
Conference_Location :
Raleigh, NC
Print_ISBN :
0-7803-9252-3
Type :
conf
DOI :
10.1109/IECON.2005.1568988
Filename :
1568988
Link To Document :
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