• DocumentCode
    2913915
  • Title

    Development of design assessment instruments and discussion of freshmen and senior design assessment results

  • Author

    Caso, Rita ; Lee, Jong-Hwan ; Froyd, Jeff ; Kohli, Ripla

  • Author_Institution
    Texas A&M Univ., College Station, TX, USA
  • Volume
    3
  • fYear
    2002
  • fDate
    6-9 Nov. 2002
  • Abstract
    At TX A&M University (TAMU), one of several educational goals, which the NSF CRCD Aerospace Engineering "Smart Materials" Project identified in 2001 was to impact students\´ learning of team-based design knowledge as a result of new curriculum it would introduce at various levels of the undergraduate program. This paper describes the systematic processes by which the Transferable Integrated Design Engineering Education (TIDEE) Project\´s Mid Program Design Assessment instrument for measuring Design Knowledge, has been used, analyzed, and adapted at TAMU to establish baselines and benchmarks to serve in the assessment of the CRCD project impact on design knowledge. The first adaptation and use of the test occurred early in fall 2001 with freshmen and with senior, capstone design students. Follow-up testing was administered to the same seniors, and to different freshmen in late spring of 2002. In addition to discussing the test adaptation development process, this paper examines the results of baseline and benchmark testing.
  • Keywords
    design engineering; educational courses; engineering education; teaching; Transferable Integrated Design Engineering Education; USA; baseline testing; benchmark testing; curriculum; design assessment instruments development; design knowledge; team-based design knowledge; undergraduate program; university; Aerospace engineering; Aerospace testing; Benchmark testing; Design engineering; Educational products; Educational programs; Instruments; Process design; Springs; Web page design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frontiers in Education, 2002. FIE 2002. 32nd Annual
  • ISSN
    0190-5848
  • Print_ISBN
    0-7803-7444-4
  • Type

    conf

  • DOI
    10.1109/FIE.2002.1158625
  • Filename
    1158625