DocumentCode
2914052
Title
Ferrite losses of cores with square wave voltage and DC bias
Author
Valchev, Vencislav C. ; Van den Bossche, Alex P. ; Van de Sype, David M.
Author_Institution
Dept. of Electron., Tech. Univ. of Varna
fYear
2005
fDate
6-6 Nov. 2005
Abstract
Ferrite material properties may vary depending on the grade and manufacturer. Moreover, there are differences between batches and also the production process may change in time. The same material grade may have improved or reduced performance depending on the year of production. In loss critical applications it is good to be able to test the losses on real cores. The usual voltage waveforms in power applications are closer to square wave than to sine wave. The DC bias can have a significant influence on the ferrite losses, so it is good to check this sensitivity. Losses were measured at frequencies of 20 kHz, 100 kHz and 500 kHz on 3F3 material
Keywords
loss measurement; magnetic cores; materials properties; soft magnetic materials; 20 kHz; 500 kHz; cores; ferrite losses measurement; ferrite material property; square wave voltage; Bridge circuits; Ferrites; Frequency; MOSFETs; Manufacturing; Probes; Production; Resistors; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics Society, 2005. IECON 2005. 31st Annual Conference of IEEE
Conference_Location
Raleigh, NC
Print_ISBN
0-7803-9252-3
Type
conf
DOI
10.1109/IECON.2005.1569013
Filename
1569013
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