• DocumentCode
    2914052
  • Title

    Ferrite losses of cores with square wave voltage and DC bias

  • Author

    Valchev, Vencislav C. ; Van den Bossche, Alex P. ; Van de Sype, David M.

  • Author_Institution
    Dept. of Electron., Tech. Univ. of Varna
  • fYear
    2005
  • fDate
    6-6 Nov. 2005
  • Abstract
    Ferrite material properties may vary depending on the grade and manufacturer. Moreover, there are differences between batches and also the production process may change in time. The same material grade may have improved or reduced performance depending on the year of production. In loss critical applications it is good to be able to test the losses on real cores. The usual voltage waveforms in power applications are closer to square wave than to sine wave. The DC bias can have a significant influence on the ferrite losses, so it is good to check this sensitivity. Losses were measured at frequencies of 20 kHz, 100 kHz and 500 kHz on 3F3 material
  • Keywords
    loss measurement; magnetic cores; materials properties; soft magnetic materials; 20 kHz; 500 kHz; cores; ferrite losses measurement; ferrite material property; square wave voltage; Bridge circuits; Ferrites; Frequency; MOSFETs; Manufacturing; Probes; Production; Resistors; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics Society, 2005. IECON 2005. 31st Annual Conference of IEEE
  • Conference_Location
    Raleigh, NC
  • Print_ISBN
    0-7803-9252-3
  • Type

    conf

  • DOI
    10.1109/IECON.2005.1569013
  • Filename
    1569013