Title :
Dielectric strength of vacuum interrupters influence of manufacturing process
Author :
Schellekens, Hans ; Chombart, François ; Mottin, Romain ; Vianna, Fabio
Author_Institution :
BU-Energy, Schneider-Electr., Grenoble, France
fDate :
Aug. 30 2010-Sept. 3 2010
Abstract :
A test method based on combined measurement of voltage breakdown value and position is used to measure the microscopic electric field enhancement factor on copper and stainless steel electrodes in vacuum. This method is then used to evaluate the effectiveness of an industrial cleaning process. Process parameters are identified that positively influence the dielectric strength. An improvement of 15% is obtained.
Keywords :
cleaning; electric breakdown; electric strength; metallurgical industries; stainless steel; vacuum interrupters; dielectric strength; industrial cleaning process; manufacturing process; microscopic electric field enhancement factor; vacuum interrupters; voltage breakdown value measurement; Cleaning; Microscopy; Needles; Steel; Vacuum breakdown; circuit-breaker; manufacturing; vacuum breakdown; vacuum interrupter;
Conference_Titel :
Discharges and Electrical Insulation in Vacuum (ISDEIV), 2010 24th International Symposium on
Conference_Location :
Braunschweig
Print_ISBN :
978-1-4244-8367-9
Electronic_ISBN :
1093-2941
DOI :
10.1109/DEIV.2010.5625836
