Title :
Hybrid particle swarm optimizer with advance and retreat strategy and clonal mechanism for global numerical optimization
Author :
Zhang, Junqi ; Xiao, Zhongmin ; Tan, Ying ; He, Xingui
Author_Institution :
State Key Lab. of Machine Perception, Peking Univ., Beijing
Abstract :
A novel particle swarm optimization algorithm based on advance and retreat strategy and clone mechanism (ARC-PSO) is proposed in this paper. It is well known that the advance-and-retreat strategy is a simple and effective method of one-dimensional search. We use the advance-and-retreat strategy to endow the clones with faster speed to find nearby local basins before next clonal operation. Furthermore, in the next clonal operation, the search space is enlarged greatly and the diversity of clones is increased. When the fitness value turns better after last ldquoflyingrdquo, the cloned particle advances. On the contrary, the cloned particle retreats then searches in the reverse direction of the last ldquoflyingrdquo with a small step-size of the previous velocity. Thus, the swarm has strong optimization ability. Comparisons among the proposed ARC-PSO, the conventional standard particle swarm optimization (SPSO) and the pure clone particle swarm optimization (CPSO) on thirteen benchmark test functions are presented in this paper. Experimental results show that the proposed ARC-PSO is capable of speeding up the evolution process significantly and improving the performance of global optimizer greatly.
Keywords :
particle swarm optimisation; search problems; advance-and-retreat strategy; clonal operation; clone mechanism; clone particle swarm optimization; global numerical optimization; hybrid particle swarm optimizer; one-dimensional search; particle swarm optimization algorithm; Benchmark testing; Birds; Cloning; Genetic mutations; Helium; History; Machine learning algorithms; Particle swarm optimization; Space exploration; Stochastic processes;
Conference_Titel :
Evolutionary Computation, 2008. CEC 2008. (IEEE World Congress on Computational Intelligence). IEEE Congress on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-1822-0
Electronic_ISBN :
978-1-4244-1823-7
DOI :
10.1109/CEC.2008.4631071