Title :
Pseudo-Exhaustive Built-in Self-Testing of Signal Integrity for High-Speed SoC Interconnects
Author :
Liu, H. ; Jone, Wen B ; Das, S.R.
Author_Institution :
Cincinnati Univ., Cincinnati
Abstract :
As technology approaches deep sub-micron technology and clock frequency approaches Giga Hertz, the signal integrity problem of the high speed interconnect is becoming a more and more serious issue. In this paper, we propose a pseudo-exhaustive testing scheme for signal integrity faults of high speed SoC interconnects.
Keywords :
integrated circuit interconnections; integrated circuit testing; system-on-chip; capacitive coupling; high speed interconnect; high-speed SoC interconnect; inductive coupling; pseudo-exhaustive built-in self-testing; signal integrity; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Crosstalk; Electrical fault detection; Fault detection; Integrated circuit interconnections; Signal generators; Test pattern generators; Pseudo-exhaustive testing; built-in self testing; capacitive coupling; inductive coupling; signal integrity testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference Proceedings, 2007. IMTC 2007. IEEE
Conference_Location :
Warsaw
Print_ISBN :
1-4244-0588-2
DOI :
10.1109/IMTC.2007.379372
