Title :
Experimental verification of a dual single-input single-output model of a three-phase boost-type PWM rectifier
Author :
Yin, Bo ; Oruganti, Ramesh ; Panda, S.K. ; Bhat, Ashoka K S
Author_Institution :
Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore
Abstract :
This paper proposes a simple dual SISO (single-input-single-output) model for a three-phase boost-type PWM rectifier under balanced line voltage conditions. In the proposed model, the q-axis model is a first order linear system determining the power factor regulation, whereas the d-axis model, which is shown to be similar to a traditional DC-DC boost converter, is a second-order non-linear system determining the power delivery. It is much easier to analyze and control a complex three-phase PWM rectifier using the proposed model. In addition, the complex non-minimum phase feature inherent in a AC-to-DC rectifier becomes a simple right half plane (RHP) zero appearing in the small-signal control-to-output transfer function of the proposed d-axis model. The knowledge of RHP zero´s location is vital to the successful design of a stable controller for the rectifier, as the presence of the RHP zero imposes a strict limit on the achievable closed loop performance. The validity of the proposed model is verified through experimental Bode plot results obtained using a hardware prototype
Keywords :
AC-DC power convertors; Bode diagrams; PWM rectifiers; closed loop systems; nonlinear control systems; power factor; transfer functions; AC-to-DC rectifier; Bode plot; DC-DC boost converter; closed loop performance; d-axis model; dual single-input single-output model; first order linear system; power factor regulation; q-axis model; right half plane zero location; second-order nonlinear system; three-phase boost-type PWM rectifier control; transfer function; DC-DC power converters; Hardware; Linear systems; Power system modeling; Prototypes; Pulse width modulation; Reactive power; Rectifiers; Transfer functions; Voltage;
Conference_Titel :
Industrial Electronics Society, 2005. IECON 2005. 31st Annual Conference of IEEE
Conference_Location :
Raleigh, NC
Print_ISBN :
0-7803-9252-3
DOI :
10.1109/IECON.2005.1569046