Title :
Testing Based SoC/VLSI IP Identification and Protection Platform
Author :
Fan, Yu-Cheng ; Chiang, Arvin ; Sung, Da-Cheng ; Chi, Tsung-Chen ; Jiang, Jiyin-Chang ; Hsieh, Yin-Te ; Shen, Jan-Hung
Author_Institution :
Nat. Taipei Univ. of Technol., Taipei
Abstract :
In this paper, the authors propose a novel testing based SoC/VLSI intellectual property (IP) identification and protection platform in SoC/VLSI design. The principles are established for development of a new IP identification, protection procedures and digital rights management system that depends on current IP-based design flow. This platform can successfully survive synthesis, placement, and routing and identify the IP core at various design levels. The proposed method has the potential to solve the digital rights management problem in SoC/VLSI design.
Keywords :
VLSI; circuit CAD; industrial property; integrated circuit design; integrated circuit testing; logic design; system-on-chip; IP-based design flow; SoC/VLSI IP identification; SoC/VLSI design; digital rights management system; intellectual property identification; intellectual property protection platform; system-on-chip; Cryptography; Electronic design automation and methodology; Electronic equipment testing; Fingerprint recognition; Foundries; Intellectual property; Protection; System testing; Very large scale integration; Watermarking; IP identification; IP protection; SoC/VLSI design; intellectual property (IP); testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference Proceedings, 2007. IMTC 2007. IEEE
Conference_Location :
Warsaw
Print_ISBN :
1-4244-0588-2
DOI :
10.1109/IMTC.2007.379375