DocumentCode :
2914574
Title :
Enhancement of breakdown strength by microdischarge under impulse voltage applications in vacuum
Author :
Aoki, Keita ; Nishimura, Ryouki ; Kojima, Hiroki ; Homma, Mitsutaka ; Shioiri, Tetsu ; Okubo, Hitoshi
Author_Institution :
Nagoya Univ., Nagoya, Japan
fYear :
2010
fDate :
Aug. 30 2010-Sept. 3 2010
Firstpage :
32
Lastpage :
35
Abstract :
An investigation of charge behavior such as microdischarge under high electric field in vacuum is very important in order to enhance the electrical insulation performance of vacuum circuit breakers and vacuum interrupters (VCB/VI). This paper discusses the enhancement characteristics of breakdown strength by microdischarge under applying impulse voltage repeatedly and changing vacuum pressure. As a result, microdischarge which had pulsed current waveform became smaller with repeated constant peak voltage applications under 10-6 Pa vacuum. In addition, microdischarge generation had the electrode conditioning effect to raise the breakdown voltage by reducing adsorption gas of the electrodes. Microdischarge having very small charge compared with that of breakdown has a possibility of drastic enhancement of breakdown strength in vacuum, as the non-breakdown conditioning technique.
Keywords :
discharges (electric); vacuum breakdown; vacuum circuit breakers; vacuum interrupters; VCB-VI; adsorption gas reduction; breakdown strength enhancement; electrical insulation performance; electrode conditioning effect; high electric field; impulse voltage; microdischarge generation; nonbreakdown conditioning technique; pulsed current waveform; repeated constant peak voltage; vacuum circuit breakers; vacuum insulation; vacuum interrupters; vacuum pressure; Breakdown voltage; Discharges; Electrodes; Sparks; Vacuum breakdown; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Discharges and Electrical Insulation in Vacuum (ISDEIV), 2010 24th International Symposium on
Conference_Location :
Braunschweig
ISSN :
1093-2941
Print_ISBN :
978-1-4244-8367-9
Electronic_ISBN :
1093-2941
Type :
conf
DOI :
10.1109/DEIV.2010.5625863
Filename :
5625863
Link To Document :
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