• DocumentCode
    2914697
  • Title

    A Binary Stock Event Model for stock trends forecasting: Forecasting stock trends via a simple and accurate approach with machine learning

  • Author

    Jung, Hyun Joon ; Aggarwal, J.K.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Texas at Austin, Austin, TX, USA
  • fYear
    2011
  • fDate
    22-24 Nov. 2011
  • Firstpage
    714
  • Lastpage
    719
  • Abstract
    The volatile and stochastic characteristics of securities make it challenging to predict even tomorrow´s stock prices. Better estimation of stock trends can be accomplished using both the significant and well-constructed set of features. Moreover, the prediction capability will gain momentum as we build the right model to capture unobservable attributes of the varying tendencies. In this paper, we propose a Binary Stock Event Model (BSEM) and generate features sets based on it in order to better predict the future trends of the stock market. We apply two learning models such as a Bayesian Naive Classifier and a Support Vector Machine to prove the efficiency of our approach in the aspects of prediction accuracy and computational cost. Our experiments demonstrate that the prediction accuracies are around 70-80% in one day predictions. In addition, our back-testing proves that our trading model outperforms well-known technical indicator based trading strategies with regards to cumulative returns by 30%-100%. As a result, this paper suggests that our BSEM based stock forecasting shows its excellence with regards to prediction accuracy and cumulative returns in a real world dataset.
  • Keywords
    Bayes methods; economic forecasting; learning (artificial intelligence); pattern classification; securities trading; share prices; support vector machines; Bayesian naive classifier; backtesting; binary stock event model; learning models; real world dataset; securities; stock prices; stock trends; stock trends forecasting; support vector machine; trading model; Accuracy; Bayesian methods; Companies; Computational modeling; Predictive models; Support vector machines; Testing; Back Testing; Feature Generation; Prediction; Stock forecasting;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Systems Design and Applications (ISDA), 2011 11th International Conference on
  • Conference_Location
    Cordoba
  • ISSN
    2164-7143
  • Print_ISBN
    978-1-4577-1676-8
  • Type

    conf

  • DOI
    10.1109/ISDA.2011.6121740
  • Filename
    6121740