DocumentCode :
2914897
Title :
Space and surface charge behavior analysis of plasma pre-processed dielectric thin films
Author :
Takashima, Kazunori ; Oda, Tetsuji
Author_Institution :
Dept. of Electr. Eng., Tokyo Univ., Japan
Volume :
3
fYear :
1997
fDate :
5-9 Oct 1997
Firstpage :
2052
Abstract :
In order to study the space charge behavior in dielectric thin films, a space charge distribution measuring system based on a LIPP (laser induced pressure pulse) method was constructed. Pressure pulse was generated by irradiating the absorbent on a sample surface with mode-locked pico-second YAG laser to achieve good spatial resolution. From a LIPP response of a PVDF (polyvinylidene fluoride) piezoelectric thin film, in-depth profile of the system is estimated. For example, it was estimated to be about 2 μm for PTFE (polytetrafluoro ethylene) thin film. By using space charge density distribution measurement, space and surface charge behavior of the corona-charged PTFE thin film was studied. Effect of antistatic process using low pressure discharge plasma and charge elimination process dipping in city water was also studied. Plasma processing enhances the effect of charge elimination dipping in city water
Keywords :
charge measurement; corona; laser beam applications; piezoelectric thin films; plasma applications; polymer films; solid lasers; space charge; surface charging; 2 mum; PTFE thin film; PVDF piezoelectric thin film; antistatic process; charge elimination process dipping; city water; corona-charged PTFE thin film; laser induced pressure pulse method; low pressure discharge plasma; mode-locked pico-second YAG laser; plasma pre-processed dielectric thin films; polytetrafluoro ethylene; polyvinylidene fluoride; space charge behavior analysis; space charge density distribution measurement; spatial resolution; surface charge behavior analysis; Charge measurement; Current measurement; Laser mode locking; Optical pulse generation; Piezoelectric films; Plasma density; Plasma materials processing; Plasma measurements; Pulse measurements; Space charge;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 1997. Thirty-Second IAS Annual Meeting, IAS '97., Conference Record of the 1997 IEEE
Conference_Location :
New Orleans, LA
ISSN :
0197-2618
Print_ISBN :
0-7803-4067-1
Type :
conf
DOI :
10.1109/IAS.1997.626350
Filename :
626350
Link To Document :
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