• DocumentCode
    2915447
  • Title

    GaN/AlN multiple quantum wells and waveguide fabrication for ultrafast photonic devices utilizing intersubband transition

  • Author

    Kumtornkittikul, Chaiyasit ; Waki, Ichitaro ; Li, Ning ; Sugiyama, Masakazu ; Shimogaki, Yukihiro ; Nakano, Yoshiaki

  • Author_Institution
    Res. Center for Adv. Sci. & Technol., Tokyo Univ., Japan
  • Volume
    D
  • fYear
    2004
  • fDate
    21-24 Nov. 2004
  • Firstpage
    140
  • Abstract
    Intersubband transition in GaN/AIN multiple quantum well (MQW) structures was demonstrated with metal-organic vapour phase epitaxy (MOVPE) in a wavelength range of 2.4-3.5 μm by varying the quantum well with constant barrier width. The linewidths of intersubband absorption are approximately 70 meV, indicating excellent quality of the MOVPE-grown samples. In addition to performing epitaxial growth, we calculated the intersubband absorption taking into account built-in electric field in the MQW structures. Based on optical characterization results, the induced built-in electric field in the MQW structures was found to be very strong in the order of 2-3 MV/cm. Moreover, we demonstrated the fabrication of ridge waveguide and high-mesa waveguide on the MQW samples, and successfully performed optical waveguide measurement, showing possibility to make high performance intersubband transition devices.
  • Keywords
    III-V semiconductors; MOCVD; optical waveguides; ridge waveguides; semiconductor quantum wells; vapour phase epitaxial growth; MOVPE; MQW; electric field; intersubband absorption; intersubband transition devices; metal-organic vapour phase epitaxy; multiple quantum wells; optical waveguide measurement; ridge waveguide; ultrafast photonic devices; waveguide fabrication; Absorption; Epitaxial growth; Epitaxial layers; Gallium nitride; Optical device fabrication; Optical waveguides; Performance evaluation; Quantum well devices; Ultrafast optics; Waveguide transitions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2004. 2004 IEEE Region 10 Conference
  • Print_ISBN
    0-7803-8560-8
  • Type

    conf

  • DOI
    10.1109/TENCON.2004.1414888
  • Filename
    1414888