Title :
Application of the Welch-method for the automatic parameter identification of electrical drives
Author :
Villwock, Sebastian ; Pacas, Mario ; Eutebach, Thomas
Author_Institution :
Inst. of Power Electron. & Electr. Drives, Siegen Univ.
Abstract :
This paper deals with the measurement of the frequency response of the mechanical part of a drive for the parameter identification of the plant. The system is stimulated by pseudo random binary signals. The measurement of the frequency response is part of a system identification procedure being carried out during an automatic commissioning of the drive. For the calculation of the frequency response of the mechanics the Welch-method is applied for spectral analysis. The Welch-method is known from the fields of communications engineering and measurement engineering. The present paper addresses the application of this powerful method for the identification of electrical drives. Investigations have pointed out that the pure utilization of conventional identification strategies does not yield satisfying results. Experimental results point out clearly the efficiency and flexibility of the proposed method. The paper contains many practical aspects and realization details that are important for the implementation on industrial systems. Commercial software tools cannot be utilized for the realization of identification strategies on the embedded control hardware of drives
Keywords :
commissioning; electric drives; embedded systems; frequency response; parameter estimation; spectral analysis; Welch-method; automatic commissioning; automatic parameter identification; communications engineering; electrical drive; embedded control hardware; frequency response measurement; industrial system; measurement engineering; mechanical part; pseudo random binary signal; software tool; spectral analysis; Electrical equipment industry; Frequency measurement; Frequency response; Hardware; Mechanical variables measurement; Parameter estimation; Power engineering and energy; Software tools; Spectral analysis; System identification;
Conference_Titel :
Industrial Electronics Society, 2005. IECON 2005. 31st Annual Conference of IEEE
Conference_Location :
Raleigh, NC
Print_ISBN :
0-7803-9252-3
DOI :
10.1109/IECON.2005.1569118