• DocumentCode
    2915829
  • Title

    Norm Optimal Iterative Learning Control for a Roll to Roll nano/micro-manufacturing system

  • Author

    Sutanto, Erick ; Alleyne, Andrew G.

  • Author_Institution
    Mech. Sci. & Eng. Dept., Univ. of Illinois at Urbana Champaign, Urbana, IL, USA
  • fYear
    2013
  • fDate
    17-19 June 2013
  • Firstpage
    5935
  • Lastpage
    5941
  • Abstract
    Recent advances in micro/nano-scale manufacturing have transitioned from batch modes of fabrication on rigid substrates to continuous modes of fabrication on flexible substrates. The majority of these continuous systems utilize a Roll to Roll (R2R) system approach. To maximize the effectiveness of the R2R system it is important to maintain high precision motion and tension control. For micro/nano-manufacturing the continuous substrate is often processed using both stepping motions and continuous scanning motions. In this work, a Norm Optimal Iterative Learning Controller (NOILC) is utilized to simultaneously improve the position tracking precision, as well as the web tension regulation. The approach is demonstrated on an experimental testbed for both continuous and stepping trajectories with greatly improved performance compared to H2 optimal feedback.
  • Keywords
    adaptive control; iterative methods; learning systems; manufacturing systems; microfabrication; motion control; nanofabrication; optimal control; semiconductor industry; shear modulus; substrates; R2R system; batch fabrication modes; continuous fabrication modes; continuous scanning motions; continuous substrate; continuous trajectories; flexible substrates; motion control; norm optimal iterative learning control; performance improvement; position tracking precision improvement; rigid substrates; roll-to-roll micromanufacturing system; roll-to-roll nanomanufacturing system; stepping motions; stepping trajectories; tension control; web tension regulation improvement; Abstracts; Control systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference (ACC), 2013
  • Conference_Location
    Washington, DC
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4799-0177-7
  • Type

    conf

  • DOI
    10.1109/ACC.2013.6580769
  • Filename
    6580769