DocumentCode
2916218
Title
Experimental verification of high speed AFM through local raster scanning
Author
Peng Huang ; Andersson, Sean B.
Author_Institution
Dept. of Mech. Eng., Boston Univ., Boston, MA, USA
fYear
2013
fDate
17-19 June 2013
Firstpage
6051
Lastpage
6056
Abstract
Local raster scanning is an algorithm for using the data acquired by an atomic force microscope in real time to steer the tip so that it stays on a sample of interest. The algorithm is suitable for all samples that are “string-like” in nature and has been shown through simulation and experiment to produce an order-of-magnitude improvement in imaging rate. This paper presents experiment results of applying the algorithm to gratings, demonstrating this improvement in speed. We compare the results to standard raster-scanning and discuss challenges introduced by our approach.
Keywords
atomic force microscopy; biology; atomic force microscope; experimental verification; high speed AFM; local raster scanning; order-of-magnitude improvement; Detectors; Field programmable gate arrays; Gratings; Image edge detection; Imaging; Standards; Trajectory;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference (ACC), 2013
Conference_Location
Washington, DC
ISSN
0743-1619
Print_ISBN
978-1-4799-0177-7
Type
conf
DOI
10.1109/ACC.2013.6580786
Filename
6580786
Link To Document