DocumentCode :
2916285
Title :
Identification of Correlated Device Model Parameter Values for Worst-Case Circuit Performance Analysis
Author :
Dharchoudhury, A. ; Kang, S.M.
Author_Institution :
University of Illinois at Urbana-Champaign
fYear :
1992
fDate :
4-7 Jan 1992
Firstpage :
339
Lastpage :
340
Keywords :
Analytical models; Circuit analysis; Circuit optimization; Circuit simulation; Computational modeling; Context modeling; Performance analysis; Random variables; Response surface methodology; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 1992. Proceedings., The Fifth International Conference on
ISSN :
1063-9667
Print_ISBN :
0-8186-2465-5
Type :
conf
DOI :
10.1109/ICVD.1992.658079
Filename :
658079
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2916285
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