• DocumentCode
    2916285
  • Title

    Identification of Correlated Device Model Parameter Values for Worst-Case Circuit Performance Analysis

  • Author

    Dharchoudhury, A. ; Kang, S.M.

  • Author_Institution
    University of Illinois at Urbana-Champaign
  • fYear
    1992
  • fDate
    4-7 Jan 1992
  • Firstpage
    339
  • Lastpage
    340
  • Keywords
    Analytical models; Circuit analysis; Circuit optimization; Circuit simulation; Computational modeling; Context modeling; Performance analysis; Random variables; Response surface methodology; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 1992. Proceedings., The Fifth International Conference on
  • ISSN
    1063-9667
  • Print_ISBN
    0-8186-2465-5
  • Type

    conf

  • DOI
    10.1109/ICVD.1992.658079
  • Filename
    658079
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2916285