DocumentCode :
2916703
Title :
The "G-F" 2-Valued Formula Generating Complete Set of Tests to Multiple Faults
Author :
Sheng, Yun Huan ; Li, Shao Qing
Author_Institution :
Changsha Inst. of Technology
fYear :
1992
fDate :
4-7 Jan 1992
Firstpage :
343
Lastpage :
349
Keywords :
Circuit faults; Circuit testing; Computer science; Digital circuits; Electrical fault detection; Fault detection; Fault diagnosis; Integrated circuit interconnections; Logic testing; Sociotechnical systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 1992. Proceedings., The Fifth International Conference on
ISSN :
1063-9667
Print_ISBN :
0-8186-2465-5
Type :
conf
DOI :
10.1109/ICVD.1992.658081
Filename :
658081
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2916703
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