DocumentCode
2916838
Title
Limits of quality factor in bulk-mode micromechanical resonators
Author
Chandorkar, S.A. ; Agarwal, M. ; Melamud, R. ; Candler, R.N. ; Goodson, K.E. ; Kenny, T.W.
Author_Institution
Stanford Univ., Stanford
fYear
2008
fDate
13-17 Jan. 2008
Firstpage
74
Lastpage
77
Abstract
In this paper we present the dominant energy loss mechanisms and quality factor (Q) limits in bulk mode micromechanical resonators. We demonstrate that in resonators with an appropriately designed stem connection to anchor the maximum achievable Q limit is set by either Thermoelastic dissipation (TED) or the Akhieser effect (AKE). Furthermore, we suggest a choice of materials for achieving maximum Q´s in micromechanical resonators. It is established here that silicon resonators can theoretically achieve higher Q´s than quartz and we predict that by using alternative materials, such as silicon carbide, it is possible to surpass the Q of quartz by more than an order of magnitude.
Keywords
Q-factor; micromechanical resonators; thermoelasticity; AKE; Akhieser effect; TED; bulk-mode micromechanical resonators; quality factor; thermoelastic dissipation; Capacitive sensors; Clamps; Damping; Energy loss; Frequency; Micromechanical devices; Phonons; Q factor; Stress; Thermoelasticity;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems, 2008. MEMS 2008. IEEE 21st International Conference on
Conference_Location
Tucson, AZ
ISSN
1084-6999
Print_ISBN
978-1-4244-1792-6
Electronic_ISBN
1084-6999
Type
conf
DOI
10.1109/MEMSYS.2008.4443596
Filename
4443596
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