• DocumentCode
    2916838
  • Title

    Limits of quality factor in bulk-mode micromechanical resonators

  • Author

    Chandorkar, S.A. ; Agarwal, M. ; Melamud, R. ; Candler, R.N. ; Goodson, K.E. ; Kenny, T.W.

  • Author_Institution
    Stanford Univ., Stanford
  • fYear
    2008
  • fDate
    13-17 Jan. 2008
  • Firstpage
    74
  • Lastpage
    77
  • Abstract
    In this paper we present the dominant energy loss mechanisms and quality factor (Q) limits in bulk mode micromechanical resonators. We demonstrate that in resonators with an appropriately designed stem connection to anchor the maximum achievable Q limit is set by either Thermoelastic dissipation (TED) or the Akhieser effect (AKE). Furthermore, we suggest a choice of materials for achieving maximum Q´s in micromechanical resonators. It is established here that silicon resonators can theoretically achieve higher Q´s than quartz and we predict that by using alternative materials, such as silicon carbide, it is possible to surpass the Q of quartz by more than an order of magnitude.
  • Keywords
    Q-factor; micromechanical resonators; thermoelasticity; AKE; Akhieser effect; TED; bulk-mode micromechanical resonators; quality factor; thermoelastic dissipation; Capacitive sensors; Clamps; Damping; Energy loss; Frequency; Micromechanical devices; Phonons; Q factor; Stress; Thermoelasticity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 2008. MEMS 2008. IEEE 21st International Conference on
  • Conference_Location
    Tucson, AZ
  • ISSN
    1084-6999
  • Print_ISBN
    978-1-4244-1792-6
  • Electronic_ISBN
    1084-6999
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2008.4443596
  • Filename
    4443596