DocumentCode :
2916838
Title :
Limits of quality factor in bulk-mode micromechanical resonators
Author :
Chandorkar, S.A. ; Agarwal, M. ; Melamud, R. ; Candler, R.N. ; Goodson, K.E. ; Kenny, T.W.
Author_Institution :
Stanford Univ., Stanford
fYear :
2008
fDate :
13-17 Jan. 2008
Firstpage :
74
Lastpage :
77
Abstract :
In this paper we present the dominant energy loss mechanisms and quality factor (Q) limits in bulk mode micromechanical resonators. We demonstrate that in resonators with an appropriately designed stem connection to anchor the maximum achievable Q limit is set by either Thermoelastic dissipation (TED) or the Akhieser effect (AKE). Furthermore, we suggest a choice of materials for achieving maximum Q´s in micromechanical resonators. It is established here that silicon resonators can theoretically achieve higher Q´s than quartz and we predict that by using alternative materials, such as silicon carbide, it is possible to surpass the Q of quartz by more than an order of magnitude.
Keywords :
Q-factor; micromechanical resonators; thermoelasticity; AKE; Akhieser effect; TED; bulk-mode micromechanical resonators; quality factor; thermoelastic dissipation; Capacitive sensors; Clamps; Damping; Energy loss; Frequency; Micromechanical devices; Phonons; Q factor; Stress; Thermoelasticity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 2008. MEMS 2008. IEEE 21st International Conference on
Conference_Location :
Tucson, AZ
ISSN :
1084-6999
Print_ISBN :
978-1-4244-1792-6
Electronic_ISBN :
1084-6999
Type :
conf
DOI :
10.1109/MEMSYS.2008.4443596
Filename :
4443596
Link To Document :
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