Title :
BP neural network approach to module fault diagnosis for large analog circuit
Author :
He, Yigang ; Li, Yun ; Liu, Meirong
Author_Institution :
Coll. of Electr. & Inf. Eng., Hunan Univ., Changsha, China
Abstract :
According to circuit decomposition technology and crossover tearing technology, a fast approach of module level fault diagnosis for large analog circuit based on BP (back propagation) neural network is presented. The new approach is based on parallel diagnosis, so fault modules can be located quickly and effectively. The availability of the method is examined by simulation.
Keywords :
analogue circuits; backpropagation; fault diagnosis; neural nets; power engineering computing; BP; analog circuit; back propagation neural network; circuit decomposition technology; crossover tearing technology; fault diagnosis; Analog circuits; Circuit faults; Circuit simulation; Circuit testing; Educational institutions; Fault diagnosis; Helium; Large-scale systems; Neural networks; Pattern recognition;
Conference_Titel :
TENCON 2004. 2004 IEEE Region 10 Conference
Print_ISBN :
0-7803-8560-8
DOI :
10.1109/TENCON.2004.1414953