DocumentCode :
2917277
Title :
A New Strategy for Pairwise Test Case Generation
Author :
Cui, Yingxia ; Li, Longshu ; Yao, Sheng
Author_Institution :
Dept. of Comput. Sci. & Technol., Anhui Univ., Hefei, China
Volume :
3
fYear :
2009
fDate :
21-22 Nov. 2009
Firstpage :
303
Lastpage :
306
Abstract :
Pairwise testing has become an important approach to software testing because it often provides effective error detection at low cost, and a key problem of it is the test case generation method. As the part of an effort to develop an optimized strategy for pairwise testing, this paper proposes an efficient pairwise test case generation strategy, called VIPO (Variant of In-Parameter-order), which is a variant of IPO strategy. We compare its effectiveness with some existing strategies including IPO, Tconfig, Pict and AllPairs. Experimental results demonstrate that VIPO outperformed them in terms of the number of generated test case within reasonable execution times, in most cases.
Keywords :
combinatorial mathematics; error detection; program testing; VIPO; combinatorial testing; effective error detection; pairwise test case generation; software testing; variant of in-parameter-order; Application software; Benchmark testing; Computer errors; Computer science; Costs; Information technology; Performance evaluation; Software quality; Software testing; System testing; horizontal growth; pairwise testing; test case generation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Information Technology Application, 2009. IITA 2009. Third International Symposium on
Conference_Location :
Nanchang
Print_ISBN :
978-0-7695-3859-4
Type :
conf
DOI :
10.1109/IITA.2009.416
Filename :
5369430
Link To Document :
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