Title :
An Approach to Minimize Testability Overhead for BILBO based Built-In-Self-Test
Author :
Basu, Anupam ; Wilson, T.C. ; Banerji, D.K. ; Majithia, J.C.
Author_Institution :
University of Guelph
Keywords :
Built-in self-test; Circuit testing; Computer science; Cost function; Delay effects; Design for testability; Hardware; Registers; Scheduling algorithm; Search problems;
Conference_Titel :
VLSI Design, 1992. Proceedings., The Fifth International Conference on
Print_ISBN :
0-8186-2465-5
DOI :
10.1109/ICVD.1992.658084
