• DocumentCode
    2917350
  • Title

    An Approach to Minimize Testability Overhead for BILBO based Built-In-Self-Test

  • Author

    Basu, Anupam ; Wilson, T.C. ; Banerji, D.K. ; Majithia, J.C.

  • Author_Institution
    University of Guelph
  • fYear
    1992
  • fDate
    4-7 Jan 1992
  • Firstpage
    354
  • Lastpage
    355
  • Keywords
    Built-in self-test; Circuit testing; Computer science; Cost function; Delay effects; Design for testability; Hardware; Registers; Scheduling algorithm; Search problems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 1992. Proceedings., The Fifth International Conference on
  • ISSN
    1063-9667
  • Print_ISBN
    0-8186-2465-5
  • Type

    conf

  • DOI
    10.1109/ICVD.1992.658084
  • Filename
    658084
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2917350