• DocumentCode
    2917470
  • Title

    Dependable digitally-assisted mixed-signal IPs based on integrated self-test & self-calibration

  • Author

    Kerkhoff, Hans G. ; Wan, Jinbo

  • Author_Institution
    Testable Design & Test of Integrated Syst. (TDT) Group, Univ. of Twente, Enschede, Netherlands
  • fYear
    2010
  • fDate
    7-9 June 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Heterogeneous SoC devices, including sensors, analogue and mixed-signal front-end circuits and the availability of massive digital processing capability, are being increasingly used in safety-critical applications like in the automotive, medical, and the security arena. Already a significant amount of attention has been paid in literature with respect to the dependability of the digital parts in heterogeneous SoCs. This is in contrast to especially the sensors and front-end mixed-signal electronics; these are however particular sensitive to external influences over time and hence determining their dependability. This paper provides an integrated SoC/IP approach to enhance the dependability. It will give an example of a digitally-assisted mixed-signal front-end IP which is being evaluated under its mission profile of an automotive tyre pressure monitoring system. It will be shown how internal monitoring and digitally-controlled adaptation by using embedded processors can help in terms of improving the dependability of this mixed-signal part under harsh conditions for a long time.
  • Keywords
    calibration; industrial property; integrated circuit reliability; integrated circuit testing; system-on-chip; analogue circuits; automotive tyre pressure monitoring system; dependable digitally-assisted mixed-signal IP; embedded processors; front-end mixed-signal electronics; heterogeneous SoC devices; integrated SoC/IP approach; integrated self-calibration; integrated self-test; massive digital processing; mixed-signal front-end circuits; sensors; Aging; Automatic testing; Automotive engineering; Availability; Built-in self-test; Circuit testing; Medical tests; Safety; System testing; Tires; aging; availability; dependability; mixedsignal testing; reliability; safety; self-calibration; self-repair; self-test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2010 IEEE 16th International
  • Conference_Location
    La Grande Motte
  • Print_ISBN
    978-1-4244-7792-0
  • Electronic_ISBN
    978-1-4244-7791-3
  • Type

    conf

  • DOI
    10.1109/IMS3TW.2010.5503008
  • Filename
    5503008