DocumentCode
2917695
Title
Ambulatory REACT: Real-time seizure detection with a DSP microprocessor
Author
McEvoy, Robert P. ; Faul, Stephen ; Marnane, William P.
Author_Institution
Dept. of Electr. & Electron. Eng., Univ. Coll. Cork, Cork, Ireland
fYear
2010
fDate
Aug. 31 2010-Sept. 4 2010
Firstpage
2443
Lastpage
2446
Abstract
REACT (Real-Time EEG Analysis for event deteCTion) is a Support Vector Machine based technology which, in recent years, has been successfully applied to the problem of automated seizure detection in both adults and neonates. This paper describes the implementation of REACT on a commercial DSP microprocessor; the Analog Devices Blackfin®. The primary aim of this work is to develop a prototype system for use in ambulatory or in-ward automated EEG analysis. Furthermore, the complexity of the various stages of the REACT algorithm on the Blackfin processor is analysed; in particular the EEG feature extraction stages. This hardware profile is used to select a reduced, platform-aware feature set, in order to evaluate the seizure classification accuracy of a lower-complexity, lower-power REACT system.
Keywords
digital signal processing chips; diseases; electroencephalography; medical signal processing; neurophysiology; support vector machines; Analog Devices Blackfin processor; DSP microprocessor; REACT algorithm; Real Time EEG Analysis for Event Detection; SVM based technology; ambulatory REACT; ambulatory automated EEG analysis; automated seizure detection; inward automated EEG analysis; real time seizure detection; seizure classification accuracy; support vector machine; Brain modeling; Digital signal processing; Electroencephalography; Feature extraction; Power demand; Prototypes; Real time systems; Algorithms; Computers; Electroencephalography; Equipment Design; Humans; Microcomputers; Monitoring, Ambulatory; Programming Languages; Seizures; Signal Processing, Computer-Assisted; Software; Time Factors;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location
Buenos Aires
ISSN
1557-170X
Print_ISBN
978-1-4244-4123-5
Type
conf
DOI
10.1109/IEMBS.2010.5626068
Filename
5626068
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