Title :
Novel circuit technique for reduction of active drain current in series/parallel PMOS transistors stack
Author :
Neema, Vaibhav ; Chouhan, Shailesh Singh ; Tokekar, Sanjiv
Author_Institution :
IET, Devi Ahilya Univ., Indore, India
Abstract :
Stacking of MOS transistors is used for minimization of standby current in Nano-scale CMOS circuits. Stacking of PMOS is preferred over NMOS because value of active drain current in PMOS is less than NMOS. It results because of mobility of holes in PMOS is less than mobility of electrons in NMOS. In this paper we observed active drain current consumption by series/parallel combination of two and three PMOS transistors. This observation leads to propose the novel technique for reduction of active drain current in series/parallel PMOS assembly. The effect of VGS, VDS, VSB and intermediates node voltages is also addressed. The proposed circuit is simulated for TSMC 0.18 μm technology using Spice© simulator.
Keywords :
CMOS integrated circuits; NMOS; Spice simulator; active drain current reduction; circuit technique; nanoscale CMOS circuits; series-parallel PMOS transistors stack; size 0.18 mum; CMOS logic circuits; Capacitance; Circuit simulation; Dynamic voltage scaling; Logic circuits; MOS devices; MOSFETs; Power dissipation; Stacking; Very large scale integration; Active mode; Drain current; Standby mode; Transistor Stacking;
Conference_Titel :
Electronic Devices, Systems and Applications (ICEDSA), 2010 Intl Conf on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4244-6629-0
DOI :
10.1109/ICEDSA.2010.5503038