DocumentCode :
2918129
Title :
A Multichannel Edge-Weighted Centroidal Voronoi Tessellation algorithm for 3D super-alloy image segmentation
Author :
Cao, Yu ; Ju, Lili ; Zou, Qin ; Qu, Chengzhang ; Wang, Song
Author_Institution :
Dept. of Comput. Sci. & Eng., Univ. of South Carolina, Columbia, SC, USA
fYear :
2011
fDate :
20-25 June 2011
Firstpage :
17
Lastpage :
24
Abstract :
In material science and engineering, the grain structure inside a super-alloy sample determines its mechanical and physical properties. In this paper, we develop a new Multichannel Edge-Weighted Centroidal Voronoi Tessellation (MCEWCVT) algorithm to automatically segment all the 3D grains from microscopic images of a super-alloy sample. Built upon the classical k-means/CVT algorithm, the proposed algorithm considers both the voxel-intensity similarity within each cluster and the compactness of each cluster. In addition, the same slice of a super-alloy sample can produce multiple images with different grain appearances using different settings of the microscope. We call this multichannel imaging and in this paper, we further adapt the proposed segmentation algorithm to handle such multichannel images to achieve higher grain-segmentation accuracy. We test the proposed MCEWCVT algorithm on a 4-channel Ni-based 3D super-alloy image consisting of 170 slices. The segmentation performance is evaluated against the manually annotated ground-truth segmentation and quantitatively compared with other six image segmentation/edge-detection methods. The experimental results demonstrate the higher accuracy of the proposed algorithm than the comparison methods.
Keywords :
computational geometry; image segmentation; materials science computing; nickel alloys; superalloys; 3D grain appearance; 3D superalloy image segmentation; MCEWCVT algorithm; classical k-means algorithm; ground-truth segmentation; microscopic images; multichannel edge weighted centroidal Voronoi tessellation algorithm; multichannel imaging; Clustering algorithms; Generators; Image edge detection; Image segmentation; Microscopy; Partitioning algorithms; Three dimensional displays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2011 IEEE Conference on
Conference_Location :
Providence, RI
ISSN :
1063-6919
Print_ISBN :
978-1-4577-0394-2
Type :
conf
DOI :
10.1109/CVPR.2011.5995590
Filename :
5995590
Link To Document :
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