Title :
Modeling of Multilayer Thick Film Components Using Time Domain Techniques
Author :
Almazroo, A.Y. ; Toscano, J.C. ; Elshabini-Riad, A.
Author_Institution :
Virginia Polytechnic Institute and State University
Abstract :
A technique for modeling multilayer thick film components using time domain measurements is presented. A multilayer inductor, formed by stacking spiral coils vertically with intervening dielectric layer, is used to demonstrate the technique. The component under test is placed at the end of a reference line, and a TDR waveform is acquired. A physically based model is developed to fit the TDR information.
Conference_Titel :
Precision Electromagnetic Measurements, 1988. CPEM 88 Digest. 1988 Conference on
Conference_Location :
Ibaraki, Japan
DOI :
10.1109/CPEM.1988.671373
