Title :
In vitro evaluation of surface based non-invasive breast cancer screening with Digital Image based Elasto Tomography (DIET)
Author :
Lotz, Thomas ; Simpson, Paul D. ; Stocker, Daniel ; Hann, Christopher E. ; Chase, J. Geoffrey
Author_Institution :
Dept. of Mech. Eng., Univ. of Canterbury, Christchurch, New Zealand
fDate :
Aug. 31 2010-Sept. 4 2010
Abstract :
Digital Image-based Elasto Tomography (DIET) is a non-invasive breast cancer screening modality that induces vibrations into a breast and images its surface motion with digital cameras. Disturbances in the motion are caused by areas of higher stiffness within the breast, potentially cancerous tumors. A concept is presented to detect the angular location of a tumor by analyzing the phase delay of the vibrations on the surface. The approach is verified experimentally on silicone phantom breasts with stiffer inclusions ranging from 0-32 mm. A strong signal differentiating healthy and cancerous phantoms can be seen at the second modal frequency of the breast, clearly detecting a 10 mm tumor. This approach offers great potential for this low cost and accessible breast cancer screening, as an adjunct to existing modalities.
Keywords :
biomechanics; biomedical optical imaging; cancer; elastic waves; elasticity; mammography; phantoms; tumours; vibrations; breast high stiffness areas; breast second modal frequency; breast surface motion imaging; breast vibrations; cancerous tumors; digital camera; digital image based elastotomography; in vitro DIET evaluation; silicone phantom breasts; surface based noninvasive breast cancer screening; surface vibration phase delay; tumor angular location; Breast cancer; Phantoms; Tumors; Vibrations; Breast; Breast Neoplasms; Diagnostic Imaging; Early Detection of Cancer; Elasticity Imaging Techniques; Female; Finite Element Analysis; Humans; Image Processing, Computer-Assisted; Motion; Phantoms, Imaging; Silicones; Surface Properties; Tomography;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location :
Buenos Aires
Print_ISBN :
978-1-4244-4123-5
DOI :
10.1109/IEMBS.2010.5626116