• DocumentCode
    2919174
  • Title

    Micromachined electrical mobility analyzer for wide range airborne particle classification

  • Author

    Jung, Il-Hyun ; Kim, Yong-Ho ; Park, Dongho ; Hwang, Jungho ; Kim, Yong-Jun

  • Author_Institution
    Yonsei Univ., Yonsei
  • fYear
    2008
  • fDate
    13-17 Jan. 2008
  • Firstpage
    567
  • Lastpage
    570
  • Abstract
    This paper reports a micromachined nano electrical mobility analyzer (nEMA) for nano- sized airborne particle classification. The micromachined nEMA is a particle classifier that uses both the inertia and electrical mobility of the particles for the classification. The microchannel of the nEMA is defined by silicon bulk micromachining. The collection efficiency of the solid particle, NaCl with a diameter of less than 50 nm, was examined using the nEMA by applying an electrical potential. For various electric field magnitude ranging from 10 to 160 V, the particle diameter collected in the outlet was measured. The collection efficiency of 40 nm particles was investigated by increasing an electric field, and it was highest at 70 V.
  • Keywords
    air pollution measurement; microchannel flow; micromachining; nanoparticles; particle size measurement; pattern classification; silicon; sodium compounds; NaCl; Si; collection efficiency; electrical mobility; electrical potential; microchannel; nano electrical mobility analyzer; nanosized airborne particle; particle inertia; silicon bulk micromachining; size 40 nm; voltage 10 V to 160 V; wide range airborne particle classification; Electric potential; Electric variables measurement; Fabrication; Geometry; Mechanical engineering; Microchannel; Micromachining; Particle measurements; Silicon; Solids;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 2008. MEMS 2008. IEEE 21st International Conference on
  • Conference_Location
    Tucson, AZ
  • ISSN
    1084-6999
  • Print_ISBN
    978-1-4244-1792-6
  • Electronic_ISBN
    1084-6999
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2008.4443719
  • Filename
    4443719