DocumentCode :
2919266
Title :
Radiation characterization and test methodology study of optocouplers devices for space applications
Author :
Mangeret, R. ; Bonora, L. ; Bouchet, T. ; Peyre, D. ; Harboe-Sorensen, R.
Author_Institution :
Astrium, Toulouse, France
fYear :
2001
fDate :
10-14 Sept. 2001
Firstpage :
166
Lastpage :
171
Abstract :
This work investigates the degradation of several different optocouplers for space applications. Hardened and standard (unhardened) types are tested under proton, neutron and Co60 irradiations under various bias, fluence and dose rate conditions. An attempt to define an industrial cost-effective test procedure is proposed.
Keywords :
gamma-ray effects; neutron effects; opto-isolators; proton effects; radiation hardening (electronics); 60Co gamma irradiation; bias; dose rate; fluence; industrial cost-effective test procedure; neutron irradiation; optocouplers devices; proton irradiation; radiation characterization; space applications; test methodology; Degradation; Gallium arsenide; Light emitting diodes; Manufacturing; Neutrons; Photodiodes; Phototransistors; Protons; Silicon; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on
Print_ISBN :
0-7803-7313-8
Type :
conf
DOI :
10.1109/RADECS.2001.1159275
Filename :
1159275
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2919266
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