DocumentCode :
2919355
Title :
Mixed symbolic-numerical techniques in fault diagnosis using fault rubber stamps
Author :
Al-Naima, Fawzi M. ; Al-Jewad, Bessam Z.
Author_Institution :
Dept. of Comput. Eng., Nahrain Univ., Baghdad, Iraq
fYear :
2011
fDate :
11-14 Dec. 2011
Firstpage :
33
Lastpage :
36
Abstract :
Fault diagnosis is very important for the development and maintenance of safe and reliable electronic circuits and systems. Many fault diagnosis methods were developed during the past years but the tolerance effect as well as the limited testability for large analog circuits still exist and are difficult to deal with. A symbolic fault diagnosis method for analog circuits is proposed in this paper based on rubber stamps. A method to limit the number of detectable faults in low-testability circuits is also advised based on the ratio of nominal power dissipation of each element to its power rating which is assumed to have good correlation with the element probability of failure.
Keywords :
analogue circuits; circuit reliability; circuit testing; fault diagnosis; numerical analysis; probability; analog circuits; element probability; fault rubber stamps; low-testability circuits; mixed symbolic-numerical techniques; nominal power dissipation; power rating; reliable electronic circuits; symbolic fault diagnosis method; Admittance; Circuit faults; Equations; Fault diagnosis; Mathematical model; Sparse matrices; Vectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits and Systems (ICECS), 2011 18th IEEE International Conference on
Conference_Location :
Beirut
Print_ISBN :
978-1-4577-1845-8
Electronic_ISBN :
978-1-4577-1844-1
Type :
conf
DOI :
10.1109/ICECS.2011.6122207
Filename :
6122207
Link To Document :
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