Title :
Injecting single event upsets in a digital signal processor by means of direct memory access requests: a new method for generating bit flips
Author :
Ferreyra, Pablo A. ; Marqués, Carlos A. ; Velazco, Raoul ; Calvo, Oscar
Author_Institution :
Univ. Nacional de Cordoba, Argentina
Abstract :
In this paper a novel approach for injecting Single Event Upsets, (SEU), by means of direct memory access, (DMA), mechanisms is presented. The system consists in a PC based control unit that generates DMA requests randomly in time to a board containing the processor under test, and a test unit. Experimentation performed on a digital signal processor intended to be used in a satellite project illustrates the potentialities of the proposed approach.
Keywords :
digital signal processing chips; file organisation; radiation hardening (electronics); PC based control unit; digital signal processor; direct memory access requests; generating bit flips; injecting single event upsets; Circuit faults; Circuit simulation; Digital signal processors; Field programmable gate arrays; Registers; Signal generators; Single event transient; Single event upset; Software tools; Testing;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on
Print_ISBN :
0-7803-7313-8
DOI :
10.1109/RADECS.2001.1159288
