Design and validation testing of the SEE-hardened IS1825ASRH pulse width modulator

Author

van Vonno, N.W. ; Newman, Warren H. ; Williams, Alan P. ; Marshall, Thomas G. ; Cartagena, Eric N.

Author_Institution

Intersil Corp., Melbourne, FL, USA

fYear

2001

fDate

10-14 Sept. 2001

Firstpage

261

Lastpage

265

Abstract

The industry standard 1825A voltage- or current-mode PWM controller has well known SEE problems when operated in a proton and heavy ion environment. We describe design considerations and SEE validation testing results of a version of the 1825A PWM that is hardened against these effects. The hardened part uses latch redundancy and hardened complementary BiCMOS processing to achieve improved SEE performance.

Keywords

BiCMOS digital integrated circuits; PWM power convertors; integrated circuit testing; ion beam effects; proton effects; radiation hardening (electronics); redundancy; space vehicle electronics; 1825A current-mode PWM controller; 1825A voltage-mode PWM controller; SEE validation testing results; SEE-hardened IS1825ASRH pulse width modulator; design considerations; hardened complementary BiCMOS processing; heavy ion effects; high-performance power supply applications; integrated controller; latch redundancy; proton effects; radiation hardening; single-event effects; space radiation environment; Circuits; Fabrication; Latches; Protons; Pulse width modulation; Pulsed power supplies; Radiation hardening; Space vector pulse width modulation; Telephony; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on

Print_ISBN

0-7803-7313-8

Type

conf

DOI

10.1109/RADECS.2001.1159290

Filename

1159290