Title :
Design and validation testing of the SEE-hardened IS1825ASRH pulse width modulator
Author :
van Vonno, N.W. ; Newman, Warren H. ; Williams, Alan P. ; Marshall, Thomas G. ; Cartagena, Eric N.
Author_Institution :
Intersil Corp., Melbourne, FL, USA
Abstract :
The industry standard 1825A voltage- or current-mode PWM controller has well known SEE problems when operated in a proton and heavy ion environment. We describe design considerations and SEE validation testing results of a version of the 1825A PWM that is hardened against these effects. The hardened part uses latch redundancy and hardened complementary BiCMOS processing to achieve improved SEE performance.
Keywords :
BiCMOS digital integrated circuits; PWM power convertors; integrated circuit testing; ion beam effects; proton effects; radiation hardening (electronics); redundancy; space vehicle electronics; 1825A current-mode PWM controller; 1825A voltage-mode PWM controller; SEE validation testing results; SEE-hardened IS1825ASRH pulse width modulator; design considerations; hardened complementary BiCMOS processing; heavy ion effects; high-performance power supply applications; integrated controller; latch redundancy; proton effects; radiation hardening; single-event effects; space radiation environment; Circuits; Fabrication; Latches; Protons; Pulse width modulation; Pulsed power supplies; Radiation hardening; Space vector pulse width modulation; Telephony; Testing;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on
Print_ISBN :
0-7803-7313-8
DOI :
10.1109/RADECS.2001.1159290
