DocumentCode
2920033
Title
Estimation of ion- and proton-induced SEU rate by two values of saturation cross sections
Author
Chumakov, Alexander I. ; Tverskoy, M.G.
Author_Institution
Specialized Electron. Syst., Moscow, Russia
fYear
2001
fDate
10-14 Sept. 2001
Firstpage
405
Lastpage
409
Abstract
Correlation between parameters of ion- and proton-induced Single Event Upsets is analyzed. We propose to use two values of saturation cross sections for estimation of cross section dependencies on ion LET and on proton energy.
Keywords
ion beam effects; proton effects; radiation hardening (electronics); Single Event Upsets; cross section dependencies; ion-induced SEU rate; proton-induced SEU rate; saturation cross sections; Energy exchange; Energy measurement; Information analysis; Ion accelerators; Ion beams; Life estimation; Nuclear power generation; Proton accelerators; Single event upset; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on
Print_ISBN
0-7803-7313-8
Type
conf
DOI
10.1109/RADECS.2001.1159314
Filename
1159314
Link To Document