Inverse Patterns - A Ray Tracing Approach

Inverse pattern design for profilometric measurement methods based upon the inversion of a distorted fringe pattern caused by a reference object is a common technique for both mirror-like surfaces and surfaces with diffuse reflection behavior. This paper proposes the calculation of an inverted pattern for analytically known reference objects based upon ray tracing techniques. Thus, a manufactured reference object with an associated reference fringe pattern is no longer required to fully reconstruct object shapes.