• DocumentCode
    2920250
  • Title

    Feature context for image classification and object detection

  • Author

    Wang, Xinggang ; Bai, Xiang ; Liu, Wenyu ; Latecki, Longin Jan

  • Author_Institution
    Dept. of Electron. & Inf. Eng., Huazhong Univ. of Sci. & Technol., Wuhan, China
  • fYear
    2011
  • fDate
    20-25 June 2011
  • Firstpage
    961
  • Lastpage
    968
  • Abstract
    In this paper, we presents a new method to encode the spatial information of local image features, which is a natural extension of Shape Context (SC), so we call it Feature Context (FC). Given a position in a image, SC computes histogram of other points belonging to the target binary shape based on their distances and angles to the position. The value of each histogram bin of SC is the number of the shape points in the region assigned to the bin. Thus, SC requires knowing the location of the points of the target shape. In other words, an image point can have only two labels, it belongs to the shape or not. In contrast, FC can be applied to the whole image without knowing the location of the target shape in the image. Each image point can have multiple labels depending on its local features. The value of each histogram bin of FC is a histogram of various features assigned to points in the bin region. We also introduce an efficient coding method to encode the local image features, call Radial Basis Coding (RBC). Combining RBC and FC together, and using a linear SVM classifier, our method is suitable for both image classification and object detection.
  • Keywords
    image classification; image coding; object detection; support vector machines; feature context; histogram bin; image classification; image point; linear SVM classifier; local image features; object detection; radial basis coding; shape context; shape points; target binary shape; Context; Encoding; Feature extraction; Image coding; Shape; Support vector machines; Training;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition (CVPR), 2011 IEEE Conference on
  • Conference_Location
    Providence, RI
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4577-0394-2
  • Type

    conf

  • DOI
    10.1109/CVPR.2011.5995696
  • Filename
    5995696