Title :
Characterization of low voltage SRAM response to gamma radiation
Author :
Giraud, Alain ; Gac, Jean-Pierre Le ; Armani, J.M.
Author_Institution :
DRT/LIST/DTSI/SLA, CEA/Saclay
Keywords :
Gamma rays; Low voltage; Random access memory; Resumes; Telephony; Testing;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on
Print_ISBN :
0-7803-7313-8
DOI :
10.1109/RADECS.2001.1159329
