DocumentCode
2920370
Title
Detection of Shadow Mask Defects Using Periodic Hole Placement
Author
Woo, Dong-Min
Author_Institution
Dept. of Inf. Eng., Myongji Univ., Gyeonggido
fYear
2009
fDate
20-22 Feb. 2009
Firstpage
371
Lastpage
374
Abstract
This paper presents an efficient image analysis methodology which can detect the very small hole defects reliably and rapidly from shadow mask. In fact, shadow mask line image data can be adjusted to be periodical with the period of an integer number. The inspection method mainly depends on the fact that a small defect can be significantly emphasized in terms of the comparison between image pixels departed by the period. In this paper, this comparison is implemented as FIR digital filtering algorithm, which can be rapidly processed by DSP chip. In terms of high speed line image sensing and fast algorithm by DSP, the whole inspection scheme sufficiently supports real time shadow mask handing. From the experimental results, this scheme shows a reliable inspection capability for all types of individual hole defects.
Keywords
FIR filters; digital signal processing chips; image resolution; object detection; DSP chip; FIR digital filtering algorithm; image analysis methodology; image pixels; inspection method; periodic hole placement; shadow mask defect detection; Digital filters; Digital signal processing chips; Equations; Filtering algorithms; Image analysis; Inspection; Liquid crystal displays; Organic light emitting diodes; Pixel; Shape; defect; image analysis; inspection; shadow mask;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Computer Technology, 2009 International Conference on
Conference_Location
Macau
Print_ISBN
978-0-7695-3559-3
Type
conf
DOI
10.1109/ICECT.2009.122
Filename
4795986
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