Title :
Z-scan and P-scan: new measurements of the nonlinear refractive index of single crystal polymer PTS at 1600 nm
Author :
Yoshino, F. ; Polyakov, S. ; Liu, Minggang ; Stegeman, G.
Author_Institution :
Sch. of Opt., Univ. of Central Florida, Orlando, FL, USA
Abstract :
Summary form only given. The poly[bis(p-toluene sulfonate)] of 2,4-hexadine-1,6-diol (PTS) is a conjugated polymer which exhibits strong /spl pi/-electron delocalization and large nonlinear optical effects. Previously, the nonlinear refractive index change was reported to be /spl Delta/n=n/sub 2/I+n/sub 3/I/sup 2/ with n/sub 2/=2.2/spl times/10/sup -3/ cm/sup 2//GW and n/sub 3/=-0.8/spl times/10/sup -3/ cm/sup 4//GW/sup 2/ with 65 ps pulses at 1600 nm using the Z-scan technique. Such a negative n/sub 3/ usually signifies the onset of the saturation of some nearby state. However, no such state was found to exist. A key problem was that the optical quality of the PTS crystals was poor and could have led to misleading measurements. After a successful crystal development program, very good quality PTS crystals have been made. We report new Z-scan measurements on these PTS crystals with 100-fs pulses at 1600 nm and demonstrate a modified Z-scan technique, power-scan, useful for rapid measurements.
Keywords :
optical polymers; optical self-focusing; refractive index; refractive index measurement; /spl pi/-electron delocalization; 100 fs; 1600 nm; 2,4-hexadine-1,6-diol; 2,4-hexadine-1,6-diol poly[bis(p-toluene sulfonate); P-scan; Z-scan; Z-scan technique; conjugated polymer; crystal development program; large nonlinear optical effects; modified Z-scan technique; nonlinear refractive index; nonlinear refractive index change; optical quality; poly[bis(p-toluene sulfonate)]; power-scan technique; rapid measurements; saturation; single crystal polymer; Carbon capture and storage; Large Hadron Collider; Nonlinear optics; Optical imaging; Optical pumping; Optical refraction; Optical variables control; Polymers; Refractive index; Spatial resolution;
Conference_Titel :
Lasers and Electro-Optics, 2000. (CLEO 2000). Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-634-6
DOI :
10.1109/CLEO.2000.906843
