DocumentCode :
2920662
Title :
High-aspect-ratio vertical surface profiler using sensitive displacement detection by optomecanical probe
Author :
Hamaguchi, Y. ; Kubota, M. ; Pourciel, J.B. ; Mita, Y.
Author_Institution :
Univ. of Tokyo, Tokyo
fYear :
2008
fDate :
13-17 Jan. 2008
Firstpage :
884
Lastpage :
887
Abstract :
This paper proposes an optomechanical surface profiler for high aspect ratio vertical walls. The profiler consists of a bulk silicon micro cantilever probe with a vertical mirror at its end and an integrated sheath fiberguide to insert thinned optical fiber, all fabricated by deep reactive ion etching (DRIE). The probe reflects light by integrated vertical mirror and detects the surface contact point by measuring light power attenuation, which decreases according to the overdrive distance from the contact point. A new stair-shape vertical mirror showed a high (-7.3 dBm/mum) power-to-overdrive sensitivity at 3.5 mum overdriving displacement. Together with an original neck-pinched cantilever design, the proposed profiler showed a potential superiority to conventional piezoresistive detection method and applicability to narrower entrance high aspect ratio structures.
Keywords :
cantilevers; displacement measurement; micro-optomechanical devices; micromirrors; optical design techniques; optical fabrication; probes; silicon; sputter etching; surface topography measurement; Si; bulk silicon microcantilever probe; deep reactive ion etching; high-aspect-ratio vertical surface profiler; light power attenuation; neck-pinched cantilever design; optomechanical probe; power-to-overdrive sensitivity; sensitive displacement detection; stair-shape vertical mirror; surface contact point detection; Atom optics; High speed optical techniques; Mirrors; Optical detectors; Optical fibers; Optical sensors; Piezoresistance; Probes; Sensor phenomena and characterization; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 2008. MEMS 2008. IEEE 21st International Conference on
Conference_Location :
Tucson, AZ
ISSN :
1084-6999
Print_ISBN :
978-1-4244-1792-6
Electronic_ISBN :
1084-6999
Type :
conf
DOI :
10.1109/MEMSYS.2008.4443798
Filename :
4443798
Link To Document :
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