DocumentCode :
2920891
Title :
SEGP-Finder: Tool for identification of Soft Error Glitch-Propagating paths at gate level
Author :
Hamad, Ghaith Bany ; Mohamed, Otmane Ait ; Hasan, Syed Rafay ; Savaria, Yvon
Author_Institution :
Dept. of Electr. & Comput., Eng., Concordia Univ., Montreal, QC, Canada
fYear :
2011
fDate :
11-14 Dec. 2011
Firstpage :
358
Lastpage :
361
Abstract :
An increase in vulnerability to soft errors has affected the reliability of both synchronous and asynchronous nanometer scale integrated circuits. Hence in such circuits there is a growing need to identify the soft error glitch propagation possibility before their physical design implementation. This paper proposes a new tool, the Soft Error Glitch-Propagating path Finder (SEGP-Finder), able to analyze the propagation of soft errors at gate level. In SEGP-Finder, soft error modeling is accomplished via Multiway Decision Graphs (MDGs) and Glitch Propagation sets (GP sets). To demonstrate the effectiveness of our tool, several ISCAS89 sequential benchmark circuits, 4-bit and 8-bit adders, 4-bit multiplier, and the Self-timed multiple-group pipeline asynchronous handshake circuit have been analyzed. Results indicate that SEGP-Finder is on average more than 5 times faster, without compromising on the accuracy, in comparison with simulation-based and SAT (satisfiability analysis) based techniques.
Keywords :
adders; electronic engineering computing; logic design; logic gates; multiplying circuits; radiation hardening (electronics); ISCAS89 sequential benchmark circuit; SAT; SEGP finder; adder; gate level; glitch propagation set; multiplier; multiway decision graphs; satisfiability analysis; self timed multiple group pipeline asynchronous handshake circuit; soft error glitch propagating path finder; word length 4 bit; Adders; Boolean functions; Circuit faults; Data structures; Integrated circuit modeling; Logic gates; Sequential circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits and Systems (ICECS), 2011 18th IEEE International Conference on
Conference_Location :
Beirut
Print_ISBN :
978-1-4577-1845-8
Electronic_ISBN :
978-1-4577-1844-1
Type :
conf
DOI :
10.1109/ICECS.2011.6122287
Filename :
6122287
Link To Document :
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