DocumentCode
2920966
Title
Polarization correlations in pulsed VCSELs
Author
Shelly, D.R. ; Garrison, T.W.S. ; Beck, M. ; Christensen, D.H.
Author_Institution
Dept. of Phys., Whitman Co., Wallo Wallo, WA, USA
fYear
2000
fDate
7-12 May 2000
Firstpage
168
Lastpage
169
Abstract
Summary form only given. Vertical-cavity surface-emitting lasers (VCSELs) exhibit very interesting physical properties and have great potential for use in optical communications. However, the physical mechanisms that lead to polarization selection in VCSELs are not completely understood, despite much research. We have measured polarization correlations in a pulsed VCSEL. We apply short (3-30 ns) current pulses to the laser and collimate the emitted light with a lens. The laser emission is analyzed into two orthogonal linear polarizations using a polarizing beamsplitter. The two outputs are then detected simultaneously with two photodiodes. Our detection system is calibrated to measure the number of photoelectrons, generated in each detector, which in our experiment accurately reflects the number of incident photons to within our overall detection efficiency.
Keywords
laser variables measurement; light polarisation; optical beam splitters; optical collimators; optical correlation; optical polarisers; photodetectors; photodiodes; semiconductor lasers; surface emitting lasers; 3 to 30 ns; current pulses; detector; incident photons; lens; optical communications; orthogonal linear polarizations; overall detection efficiency; photodiodes; photoelectrons; physical mechanisms; physical properties; polarization correlations; polarization selection; polarizing beamsplitter; pulsed VCSEL; pulsed VCSELs; vertical-cavity surface-emitting lasers; Laser theory; Lenses; Optical collimators; Optical fiber communication; Optical polarization; Optical pulses; Photodiodes; Pulse measurements; Surface emitting lasers; Vertical cavity surface emitting lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2000. (CLEO 2000). Conference on
Conference_Location
San Francisco, CA, USA
Print_ISBN
1-55752-634-6
Type
conf
DOI
10.1109/CLEO.2000.906868
Filename
906868
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