DocumentCode :
2921029
Title :
CAI system on `Semiconductors´ considering individual student´s ability and attitudes
Author :
Araki, Yoshikazu ; Nakajima, Akira ; Ono, Toshio ; Imamura, Hiroo ; Kobori, Yoh
Author_Institution :
Saitama Inst. of Technol., Japan
fYear :
1991
fDate :
21-24 Sep 1991
Firstpage :
501
Lastpage :
505
Abstract :
The authors introduce a practical teaching system on `Semiconductors´ to cope with mass education. The system consists of the conventional lecture, CAI (computer-aided instruction), and CMI (computer-managed instruction). The CMI system gives students constant feedback concerning academic progress. Computerized tests are given to monitor students´ academic progress. The learning record is utilized for evaluation and advice. It is used for both giving credit and evaluating the system. It is also used to analyze the relationships between the level of difficulty of a given problem and the amount of a student´s self-confidence when facing the problem and a student´s actual grade on the problem. This information helps the teachers to advise students. In order to monitor a student´s attitudes, questionnaires given at the beginning and the end of the course are used. The questions include those concerning the purpose of the college, lectures, examinations, and learning systems
Keywords :
computer aided instruction; education; electrical engineering; teaching; CAI; CMI; Semiconductors; academic progress; college; computer-managed instruction; examinations; learning record; lectures; mass education; students; teachers; teaching system; testing; Computer aided instruction; Computer science education; Computerized monitoring; Courseware; Educational institutions; Feedback; Learning systems; Physics; Tellurium; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frontiers in Education Conference, 1991. Twenty-First Annual Conference. 'Engineering Education in a New World Order.' Proceedings.
Conference_Location :
West Lafayette, IN
Print_ISBN :
0-7803-0222-2
Type :
conf
DOI :
10.1109/FIE.1991.187534
Filename :
187534
Link To Document :
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