DocumentCode :
2921127
Title :
Carrier capture in 1.3 /spl mu/m InAsP-InGaAsP quantum well laser structures
Author :
Slaby, R. ; Vaschenko, G. ; Menoni, C.S. ; Robinson, G.Y. ; Pikal, J.M. ; Sotomayor Torres, C.M.
Author_Institution :
Bergische Univ., Wuppertal, Germany
fYear :
2000
fDate :
7-12 May 2000
Firstpage :
176
Abstract :
Summary form only given. Carrier transport, capture and escape processes in multiple quantum well (MQW) lasers have been shown to affect the high speed and static characteristics of the device. Recently, we have demonstrated that these processes also significantly affect the bias-dependent carrier lifetime, and consequently the recombination parameters that are extracted from this lifetime. In this work we investigate carrier transport processes in InAsP-InGaAsP MQW lasers from the transient response of the photoexcited emission created under conditions of high excitation.
Keywords :
III-V semiconductors; carrier lifetime; carrier mobility; gallium arsenide; gallium compounds; indium compounds; infrared sources; laser transitions; quantum well lasers; transients; 1.3 /spl mu/m InAsP/InGaAsP quantum well laser structures; 1.3 mum; InAsP-InGaAsP; InAsP-InGaAsP MQW lasers; bias-dependent carrier lifetime; carrier capture; carrier escape; carrier transport; carrier transport processes; high excitation; high speed characteristics; photoexcited emission; recombination parameters; static characteristics; transient response; Absorption; Charge carrier density; Filling; Gallium arsenide; Laser excitation; Nitrogen; Quantum well devices; Quantum well lasers; Time measurement; Zinc;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2000. (CLEO 2000). Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-634-6
Type :
conf
DOI :
10.1109/CLEO.2000.906878
Filename :
906878
Link To Document :
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